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  1. Quantifying thermal transport in buried semiconductor nanostructures via Cross-Sectional Scanning Thermal Microscopy

    Spiece, J., Evangeli, C., Robson, A., Sachat, A., Hanel, L., Alonso, M., Garriga, M., Robinson, B., Oehme, M., Schulze, J., Alzina, F., Sotomayor-Torres, C. M. & Kolosov, O., 19/05/2021, In: Nanoscale. 8 p.

    Research output: Contribution to journalJournal articlepeer-review