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  1. So You Need More Method Level Datasets for Your Software Defect Prediction? Voilà!

    Shippey, T., Hall, T., Counsell, S. & Bowes, D., 8/09/2016, ESEM '16 Proceedings of the 10th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement. New York: IEEE Computer Society, 6 p. 12

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review