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Results for Charge coupled devices

Publications & Outputs

  1. Detecting bias due to input modelling in computer simulation

    Morgan, L., Nelson, B. L., Titman, A. C. & Worthington, D. J., 3/12/2017, 2017 Winter Simulation Conference (WSC). Piscataway, NJ, USA: IEEE Press, p. 1974-1985 12 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  2. Application of imaging systems to characterization of single-event effects in high-energy neutron environments

    Török, Z. & Platt, S. P., 1/12/2006, In: IEEE Transactions on Nuclear Science. 53, 6, p. 3718-3725 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review