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Results for Fin field-effect transistors

Publications & Outputs

  1. Understanding the effect of confinement in scanning spreading resistance microscopy measurements

    Pandey, K., Paredis, K., Robson, A. J. & Vandervorst, W., 21/07/2020, In: Journal of Applied Physics. 128, 3, 11 p., 034303.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review