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  1. Electrode variability and its impact on the characteristics of M@C80 molecular junctions (M = P, S, As, Se)

    Oda, A. A., Al-Jobory, A. A., Nawaf, S., Lattoofi, N. F., Motlak, M. & Ismael, A., 15/11/2025, In: Materials Science in Semiconductor Processing. 199, 109822.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review