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Results for IDDQ • Reliability testing • Reliability indicators • Supply current testing • VLSI testing

Publications & Outputs

  1. The application of IDDX test strategies in analogue and mixed signal IC's

    Richardson, A., Bratt, A., Baturone, I. & HUERTAS, J. L., 22/06/1995. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review

  2. Supply current monitoring in cmos circuits for reliability prediction and test.

    Richardson, A. M. D. & Dorey, A. P., 1992, In: Quality and Reliability Engineering International. 8, 6, p. 543-548 6 p.

    Research output: Contribution to journalJournal article