Lawman, S.,
Zhang, J.,
Williams, B. M.,
Zheng, Y. &
Shen, Y. C.,
25/06/2017,
Optical Measurement Systems for Industrial Inspection X. Lehmann, P., Goncalves, A. A. & Osten, W. (eds.).
SPIE,
9 p. 103290J. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10329).
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
