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  1. Phase Locked Loop Test Methodology

    Richardson, A. & Burbidge, M., 2008, Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 277-306 30 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter (peer-reviewed)