Results for SRF thin film testing cavities

Publications & Outputs

1. Devices for SRF material characterization

   Goudket, P., Junginger, T. & Xiao, B. P., 15/11/2016, In: Superconductor Science and Technology. 30, 1, 13 p., 013001.

   Research output: Contribution to Journal/Magazine › Review article › peer-review