Results for Semiconductor device testing

Publications & Outputs

1. Minimally invasive neutron beam monitoring for single-event effects accelerated testing

   Zhang, L. H. & Platt, S. P., 1/12/2011, RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings. p. 945-949 5 p. 6131336. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

   Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper