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Results for analogue test

Publications & Outputs

  1. Design-for-test (DfT) study on a current mode DAC

    Olbrich, T., Mozuelos, R., Richardson, A. & Bracho, S., 12/1996, In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 374-379 6 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  2. Defect oriented test development based on inductive fault analysis

    Richardson, A., Kerkhoff, H. G. & Harvey, R., 22/06/1995, p. 2-11. 10 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

  3. The application of IDDX test strategies in analogue and mixed signal IC's

    Richardson, A., Bratt, A., Baturone, I. & HUERTAS, J. L., 22/06/1995. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper › peer-review