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  1. High throughput mechanical property testing of materials libraries using capacitance

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 12/08/2004, IPC No. GO1R 27/26, Patent No. US 2004/0155668 A1

    Research output: Patent

  2. Equipment and apparatus for measuring physical properties of material with high throughput

    Hajduk, D., Carlson, E., Freitag, C. & Kolosov, O., 14/07/2004, IPC No. GO1N 3/00;, Patent No. JP3543088(B2)

    Research output: Patent

  3. High throughput mechanical property testing of materials libraries using a piezoelectric

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 17/06/2004, IPC No. GOIN 3/10,3/36, Patent No. US 2004/0113602 A1

    Research output: Patent

  4. High throughput mechanical property testing of materials libraries using a piezoelectric

    Hajduk, D. A., Carlson, E. D., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 18/11/2003, IPC No. GOIN 3/10,3/36, Patent No. US 6,650,102 B2

    Research output: Patent

  5. High throughput preparation and analysis of plastically shaped material samples

    Hajduk, D. & Kolosov, O., 31/07/2003, IPC No. B05D 1/40; B29C 31/00, Patent No. US7,013,709 B2

    Research output: Patent

  6. High throughput mechanical property and bulge testing of materials libraries

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 6/03/2003, IPC No. GO1N 3/08, Patent No. US6772642

    Research output: Patent

  7. High throughput mechanical property and bulge testing of materials libraries

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 6/03/2003, IPC No. GOIL 1/24, Patent No. US 2003/0041672 A1

    Research output: Patent

  8. High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric

    Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 6/03/2003, IPC No. GOIN 3/10,3/36, Patent No. WO 03/019150 A1

    Research output: Patent

  9. Instrument for high throughput measurement of material physical properties and method of using same

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 14/03/2002, IPC No. GO1N 3/00, Patent No. US6936471

    Research output: Patent

  10. Instrument for high throughput measurement of material physical properties of a plurality of samples

    Hajduk, D., Carlson, E., Freitag, C. & Kolosov, O., 28/02/2002, IPC No. GO1D 1/16; GO1D 7/02; GO1N 3/00; GO1N 3/24; GO1M 7/00, Patent No. US 6679130 B2

    Research output: Patent

  11. Instrument for high throughput measurement of material physical properties

    Hajduk, D., Carlson, E., Freitag, C. & Kolosov, O., 23/01/2002, IPC No. GO1D 1/16; GO1D 7/02; GO1N 3/00; GO1N 3/24; GO1M 7/00, Patent No. JP2002-22630A

    Research output: Patent

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