Results for integrated circuit testing

Publications & Outputs

1. Characterization of the ANITA neutron source for accelerated SEE testing at the Svedberg laboratory

   Prokofiev, A. V., Blomgren, J., Nolte, R., Platt, S. P., Röttger, S. & Smirnov, A. N., 1/12/2008, 2008 European Conference on Radiation and Its Effects on Components and Systems, RADECS 2008. IEEE, p. 260-267 8 p. 5782723. (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS).

   Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper

2. Nanometer-scale mechanical imaging of aluminum damascene interconnect structures in a low-dielectric-constant polymer.

   Kolosov, O., Briggs, G. A. D., Geer, R. E. & Shekhawat, G. S., 1/04/2002, In: Journal of Applied Physics. 91, 7, p. 4549-4555 7 p.

   Research output: Contribution to Journal/Magazine › Journal article › peer-review