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  1. Researcher bias: The use of machine learning in software defect prediction

    Shepperd, M., Bowes, D. & Hall, T., 1/06/2014, In: IEEE Transactions on Software Engineering. 40, 6, p. 603-616 14 p., 6824804.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review