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Dr Alexander Robson

Formerly at Lancaster University

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  1. Journal article
  2. Published

    High-accuracy analysis of nanoscale semiconductor layers using beam-exit Ar-ion polishing and scanning probe microscopy

    Robson, A., Grishin, I., Young, R., Sanchez, A. M., Kolosov, O. & Hayne, M., 2013, In: ACS Applied Materials and Interfaces. 5, 8, p. 3241-3245 5 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

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