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Professor Oleg Kolosov SFHEA

Professor of Nanoscience

  1. Published

    From molecular-scale electrical double layer structure to 3D nano-rheology properties of solid electrolyte interphase

    Chen, Y., Gonzalez-Munoz, S., Wu, W. & Kolosov, O., 4/07/2023, p. 442. 2 p.

    Research output: Contribution to conference - Without ISBN/ISSN Abstractpeer-review

  2. Published
  3. Published

    GaSb quantum dot morphology for different growth temperatures and the dissolution effect of the GaAs capping layer.

    Ahmad Kamarudin, M., Hayne, M., Zhuang, Q. D., Kolosov, O., Nuytten, T., Moshchalkov, V. V. & Dinelli, F., 26/01/2010, In: Journal of Physics D: Applied Physics. 43, 6, p. 065402

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  4. Published

    Geometrically Enhanced Thermoelectric Effects in Graphene Nanoconstrictions

    Harzgeim, A., Spiece, J., Evangeli, C., McCann, E., Falko, V., Sheng, Y., Warner, J. H., Briggs, G. A. D., Mol, J. A., Gehring, P. & Kolosov, O. V., 2018, In: Nano Letters. 18, 12, p. 7719-7725 7 p.

    Research output: Contribution to Journal/MagazineLetterpeer-review

  5. Published

    Graphitic platform for self-catalysed InAs nanowires growth by molecular beam epitaxy

    Zhuang, Q., Anyebe, E., Sanchez, A. M., Rajpalke, M. K., Veal, T. D., Zhukov, A., Robinson, B., Anderson, F., Kolosov, O. & Falko, V., 25/06/2014, In: Nanoscale Research Letters. 9, 7 p., 321.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  6. Published

    Heterodyne force microscopy of PMMA/rubber nanocomposites: nanomapping of viscoelastic response at ultrasonic frequencies

    Cuberes, M. T., Assender, H. E., Briggs, G. A. D. & Kolosov, O., 7/10/2000, In: Journal of Physics D: Applied Physics. 33, 19, p. 2347-2355 9 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  7. Published

    High precision tuning fork sensor for liquid property measurements

    Matsiev, L., Bennett, J. & Kolosov, O., 1/12/2005, IEEE Ultrasonics Symposium, 2005.. IEEE, Vol. 3. 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  8. Published

    High throughput mechanical property and bulge testing of materials libraries

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 6/03/2003, IPC No. GOIL 1/24, Patent No. US 2003/0041672 A1

    Research output: Patent

  9. Published

    High throughput mechanical property and bulge testing of materials libraries

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 6/03/2003, IPC No. GO1N 3/08, Patent No. US6772642

    Research output: Patent

  10. Published

    High throughput mechanical property testing of materials libraries using a piezoelectric

    Hajduk, D. A., Carlson, E. D., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 18/11/2003, IPC No. GOIN 3/10,3/36, Patent No. US 6,650,102 B2

    Research output: Patent

  11. Published

    High throughput mechanical property testing of materials libraries using a piezoelectric

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 17/06/2004, IPC No. GOIN 3/10,3/36, Patent No. US 2004/0113602 A1

    Research output: Patent

  12. Published

    High throughput mechanical property testing of materials libraries using capacitance

    Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 12/08/2004, IPC No. GO1R 27/26, Patent No. US 2004/0155668 A1

    Research output: Patent

  13. Published

    High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric

    Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R. & Matsiev, L., 6/03/2003, IPC No. GOIN 3/10,3/36, Patent No. WO 03/019150 A1

    Research output: Patent

  14. Published

    High throughput microbalance

    Carlson, E. & Kolosov, O., 1/11/2007, IPC No. GOIN 29/00, Patent No. US 2007/0251323 A1

    Research output: Patent

  15. Published

    High throughput microbalance and methods of using same

    Carlson, E., Kolosov, O. & Matsiev, L., 4/08/2005, IPC No. GOIN 29/00, Patent No. US7207211B2

    Research output: Patent

  16. Published

    High throughput microbalance and methods of using same

    Carlson, E., Kolosov, O. & Matsiev, L., 24/04/2007, IPC No. GOIN 29/00, Patent No. US 7,207,211 B2

    Research output: Patent

  17. Published

    High throughput microbalance and methods of using same

    Carlson, E., Kolosov, O., Mazzola, L., Spitkovsky, M. & Gallipeo, J., 1/11/2007, IPC No. G01N 29/16, Patent No. US 6,928,877 B2

    Research output: Patent

  18. Published

    High throughput microbalance and methods of using the same

    Carlson, E., Kolosov, O., Matsiev, L., Mazzola, L., Spitkovsky, M. & Gallipeo, J., 4/08/2004, IPC No. G01N 29/16, Patent No. US 2005/0166679 A1

    Research output: Patent

  19. Published

    High throughput permeability testing of materials libraries

    Hajduk, D. & Kolosov, O., 26/09/2006, IPC No. G01N 33/00, Patent No. US7112443

    Research output: Patent

  20. Published

    High throughput permeability testing of materials libraries

    Hajduk, D. & Kolosov, O., 22/04/2004, IPC No. G01N 33/00, Patent No. US 2004/0077091 Al

    Research output: Patent

  21. Published

    High throughput preparation and analysis of plastically shaped material samples

    Hajduk, D. & Kolosov, O., 31/07/2003, IPC No. B05D 1/40; B29C 31/00, Patent No. US7,013,709 B2

    Research output: Patent

  22. Published

    High throughput rheological testing of materials

    Kolosov, O. & Matsiev, L., 1/07/2004, IPC No. G01N 11/14; G01N ll/OO, Patent No. US 2004/0123650 A1

    Research output: Patent

  23. Published

    High throughput synthesis and screening in specialty polymers applications.

    Charmot, D., Mansky, P., Kolosov, O., Benoit, D., Klaerner, G., Petro, M., Jayaraman, M., Piotti, M., Chang, H. T. & Nava-Salgado, V., 08/2001, In: Abstracts of Papers of the American Chemical Society. 222, p. U307-U307 1 p.

    Research output: Contribution to Journal/MagazineMeeting abstractpeer-review

  24. Published

    High throughput testing of fluid samples using an electric field

    Carlson, E. & Kolosov, O., 30/10/2003, IPC No. G01N 27/416, Patent No. US 2003/0203500 A1

    Research output: Patent

  25. Published

    High-accuracy analysis of nanoscale semiconductor layers using beam-exit Ar-ion polishing and scanning probe microscopy

    Robson, A., Grishin, I., Young, R., Sanchez, A. M., Kolosov, O. & Hayne, M., 2013, In: ACS Applied Materials and Interfaces. 5, 8, p. 3241-3245 5 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

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