Home > Research > Researchers > Professor Oleg Kolosov > Publications

Research

Professor Oleg Kolosov SFHEA

Professor of Nanoscience

61 - 70 out of 329Page size: 10
RSS feed of this list
  1. Published

    Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks

    Chekanov, A. S., Low, T. S., Alli, S., Kolosov, O. & Briggs, A., 09/1996, In: IEEE Transactions on Magnetics. 32, 5, p. 3696-3698 3 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  2. Published

    Application of SPM for the analysis of microcracks of thin-film head alumina

    Chekanov, A. S., Alli, S. & Kolosov, O., 1997, Micro/Nanotribology and its Applications. Bhushan, B. (ed.). Dordrecht: Kluwer Academic Publishers, p. 663-668 6 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

  3. Published

    Controlling Interfacial Reduction Kinetics and Suppressing Electrochemical Oscillations in Li4Ti5O12 Thin-Film Anodes

    Chen, Y., Pan, H., Lin, C., Li, J., Cai, R., Haigh, S. J., Zhao, G., Zhang, J., Lin, Y., Kolosov, O. V. & Huang, Z., 20/10/2021, In: Advanced Functional Materials. 31, 43, 13 p., 2105354.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Published

    Visualization of Na-diglyme co-intercalation induced few-layer graphene expansion and SEI formation using operando electrochemical atomic force microscopy

    Chen, Y., Kolosov, O., Jarvis, S., Isaaks, M. & Palgrave, R., 18/08/2021, Graphene Week 2021.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper

  5. Published

    Revealing the nanoscale fundamentals of batteries performance via x-sectional in-situ/operando Electrochemical SPM

    Chen, Y., Rodrigues Costa, S., Nagarathinam, M., Tapia-Ruiz, N. & Kolosov, O., 8/07/2021.

    Research output: Contribution to conference - Without ISBN/ISSN › Abstract

  6. Published

    Nanoarchitecture factors of solid – electrolyte interphase formation via 3D nano-rheology microscopy and surface force-distance spectroscopy

    Chen, Y., Wu, W., Gonzalez Munoz, S., Forcieri, L., Wells, C., Jarvis, S., Wu, F., Young, R., Dey, A., Isaaks, M., Nagarathinam, M., Palgrave, R., Tapia-Ruiz, N. & Kolosov, O., 10/03/2023, In: Nature Communications. 14, 13 p., 1321.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  7. Published

    3D Nanoscale Morphology and Local Physical Properties of Li/Na-Ion-Battery Solid-Electrolyte-Interphase via Scanning Probe 3D Operando Nanorheology

    Chen, Y., Jarvis, S., Rodrigues Costa, S., Tapia-Ruiz, N. & Kolosov, O., 23/05/2022.

    Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

  8. Published

    From molecular-scale electrical double layer structure to 3D nano-rheology properties of solid electrolyte interphase

    Chen, Y., Gonzalez-Munoz, S., Wu, W. & Kolosov, O., 4/07/2023, p. 442. 2 p.

    Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review

  9. Published

    Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy

    Craciun, F., Verardi, P., Dinescu, M., Dinelli, F. & Kolosov, O., 30/12/1998, In: Thin Solid Films. 336, 1-2, p. 281-285 5 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  10. Published

    Early stages of growth and nanostructure of Pb(Zr,Ti)O-3 thin films observed by atomic force microscopy

    Craciun, F., Verardi, P., Dinescu, M., Dinelli, F. & Kolosov, O., 1999, Thin films epitaxial growth and nanostructures : proceedings of the EMRS Spring Conference, Strasbourg, France, June 16-19, 1998 / . Kasper, E., Wang, K. L. & Hasegawa, H. (eds.). Amsterdam: Elsevier, p. 281-285 5 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Previous 1...3 4 5 6 7 8 9 10 ...33 Next

Back to top