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Correcting ray optics at curved dielectric microresonator interfaces : Phase-space unification of Fresnel filtering and the Goos-Hanchen shift.

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Correcting ray optics at curved dielectric microresonator interfaces : Phase-space unification of Fresnel filtering and the Goos-Hanchen shift. / Schomerus, Henning; Hentschel, Martina.
In: Physical review letters, Vol. 96, No. 24, 22.06.2006, p. 243903.

Research output: Contribution to Journal/Magazine › Journal article › peer-review

Harvard

Schomerus, H & Hentschel, M 2006, 'Correcting ray optics at curved dielectric microresonator interfaces : Phase-space unification of Fresnel filtering and the Goos-Hanchen shift.', Physical review letters, vol. 96, no. 24, pp. 243903. https://doi.org/10.1103/PhysRevLett.96.243903

APA

Schomerus, H., & Hentschel, M. (2006). Correcting ray optics at curved dielectric microresonator interfaces : Phase-space unification of Fresnel filtering and the Goos-Hanchen shift. Physical review letters, 96(24), 243903. https://doi.org/10.1103/PhysRevLett.96.243903

Vancouver

Schomerus H, Hentschel M. Correcting ray optics at curved dielectric microresonator interfaces : Phase-space unification of Fresnel filtering and the Goos-Hanchen shift. Physical review letters. 2006 Jun 22;96(24):243903. doi: 10.1103/PhysRevLett.96.243903

Author

Schomerus, Henning ; Hentschel, Martina. / Correcting ray optics at curved dielectric microresonator interfaces : Phase-space unification of Fresnel filtering and the Goos-Hanchen shift. In: Physical review letters. 2006 ; Vol. 96, No. 24. pp. 243903.

Bibtex

@article{32d0649a2ce14e388322824d21d2f2d0,
title = "Correcting ray optics at curved dielectric microresonator interfaces : Phase-space unification of Fresnel filtering and the Goos-Hanchen shift.",
abstract = "We develop an amended ray-optics description for reflection at the curved dielectric interfaces of optical microresonators which improves the agreement with wave optics by about one order of magnitude. The corrections are separated into two contributions of similar magnitude, corresponding to ray displacement in independent quantum-phase-space directions, which can be identified with Fresnel filtering and the Goos-H{\~A}¤nchen shift, respectively. Hence we unify two effects which only have been studied separately in the past.",
author = "Henning Schomerus and Martina Hentschel",
year = "2006",
month = jun,
day = "22",
doi = "10.1103/PhysRevLett.96.243903",
language = "English",
volume = "96",
pages = "243903",
journal = "Physical review letters",
issn = "1079-7114",
publisher = "American Physical Society",
number = "24",

}

RIS

TY - JOUR

T1 - Correcting ray optics at curved dielectric microresonator interfaces : Phase-space unification of Fresnel filtering and the Goos-Hanchen shift.

AU - Schomerus, Henning

AU - Hentschel, Martina

PY - 2006/6/22

Y1 - 2006/6/22

N2 - We develop an amended ray-optics description for reflection at the curved dielectric interfaces of optical microresonators which improves the agreement with wave optics by about one order of magnitude. The corrections are separated into two contributions of similar magnitude, corresponding to ray displacement in independent quantum-phase-space directions, which can be identified with Fresnel filtering and the Goos-Hänchen shift, respectively. Hence we unify two effects which only have been studied separately in the past.

AB - We develop an amended ray-optics description for reflection at the curved dielectric interfaces of optical microresonators which improves the agreement with wave optics by about one order of magnitude. The corrections are separated into two contributions of similar magnitude, corresponding to ray displacement in independent quantum-phase-space directions, which can be identified with Fresnel filtering and the Goos-Hänchen shift, respectively. Hence we unify two effects which only have been studied separately in the past.

U2 - 10.1103/PhysRevLett.96.243903

DO - 10.1103/PhysRevLett.96.243903

M3 - Journal article

VL - 96

SP - 243903

JO - Physical review letters

JF - Physical review letters

SN - 1079-7114

IS - 24

ER -