Home > Research > Publications & Outputs > Lifetime statistics in chaotic dielectric micro...

Electronic data


Text available via DOI:

View graph of relations

Lifetime statistics in chaotic dielectric microresonators.

Research output: Contribution to journalJournal articlepeer-review

<mark>Journal publication date</mark>4/05/2009
<mark>Journal</mark>Physical review a
Issue number5
Pages (from-to)053806
Publication StatusPublished
<mark>Original language</mark>English


We discuss the statistical properties of lifetimes of electromagnetic quasibound states in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance-trapping phenomenon.

Bibliographic note

©2009 The American Physical Society