Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Publication date | 1997 |
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Host publication | European Design and Test Conference, 1997. ED&TC 97. Proceedings |
Place of Publication | LOS ALAMITOS |
Publisher | I E E E, COMPUTER SOC PRESS |
Pages | 573-580 |
Number of pages | 8 |
ISBN (print) | 0-8186-7786-4 |
<mark>Original language</mark> | English |
IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.