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A new quality estimation methodology for mixed-signal and analogue ICs

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

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A new quality estimation methodology for mixed-signal and analogue ICs. / Olbrich, T ; Grout, I A ; Aimine, Y E et al.
European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, 1997. p. 573-580.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

Harvard

Olbrich, T, Grout, IA, Aimine, YE, Richardson, AM & Contensou, J 1997, A new quality estimation methodology for mixed-signal and analogue ICs. in European Design and Test Conference, 1997. ED&TC 97. Proceedings . I E E E, COMPUTER SOC PRESS, LOS ALAMITOS, pp. 573-580. https://doi.org/10.1109/EDTC.1997.582419

APA

Olbrich, T., Grout, I. A., Aimine, Y. E., Richardson, A. M., & Contensou, J. (1997). A new quality estimation methodology for mixed-signal and analogue ICs. In European Design and Test Conference, 1997. ED&TC 97. Proceedings (pp. 573-580). I E E E, COMPUTER SOC PRESS. https://doi.org/10.1109/EDTC.1997.582419

Vancouver

Olbrich T, Grout IA, Aimine YE, Richardson AM, Contensou J. A new quality estimation methodology for mixed-signal and analogue ICs. In European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS: I E E E, COMPUTER SOC PRESS. 1997. p. 573-580 doi: 10.1109/EDTC.1997.582419

Author

Olbrich, T ; Grout, I A ; Aimine, Y E et al. / A new quality estimation methodology for mixed-signal and analogue ICs. European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS : I E E E, COMPUTER SOC PRESS, 1997. pp. 573-580

Bibtex

@inproceedings{0e08fc4683da45e0ac49dd75925e3036,
title = "A new quality estimation methodology for mixed-signal and analogue ICs",
abstract = "IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.",
author = "T Olbrich and Grout, {I A} and Aimine, {Y E} and Richardson, {A M} and J Contensou",
year = "1997",
doi = "10.1109/EDTC.1997.582419",
language = "English",
isbn = "0-8186-7786-4",
pages = "573--580",
booktitle = "European Design and Test Conference, 1997. ED&TC 97. Proceedings",
publisher = "I E E E, COMPUTER SOC PRESS",

}

RIS

TY - GEN

T1 - A new quality estimation methodology for mixed-signal and analogue ICs

AU - Olbrich, T

AU - Grout, I A

AU - Aimine, Y E

AU - Richardson, A M

AU - Contensou, J

PY - 1997

Y1 - 1997

N2 - IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.

AB - IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.

U2 - 10.1109/EDTC.1997.582419

DO - 10.1109/EDTC.1997.582419

M3 - Conference contribution/Paper

SN - 0-8186-7786-4

SP - 573

EP - 580

BT - European Design and Test Conference, 1997. ED&TC 97. Proceedings

PB - I E E E, COMPUTER SOC PRESS

CY - LOS ALAMITOS

ER -