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A new quality estimation methodology for mixed-signal and analogue ICs. / Olbrich, T ; Grout, I A ; Aimine, Y E et al.
European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS: I E E E, COMPUTER SOC PRESS, 1997. p. 573-580.
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Harvard
Olbrich, T, Grout, IA, Aimine, YE
, Richardson, AM & Contensou, J 1997,
A new quality estimation methodology for mixed-signal and analogue ICs. in
European Design and Test Conference, 1997. ED&TC 97. Proceedings . I E E E, COMPUTER SOC PRESS, LOS ALAMITOS, pp. 573-580.
https://doi.org/10.1109/EDTC.1997.582419APA
Olbrich, T., Grout, I. A., Aimine, Y. E.
, Richardson, A. M., & Contensou, J. (1997).
A new quality estimation methodology for mixed-signal and analogue ICs. In
European Design and Test Conference, 1997. ED&TC 97. Proceedings (pp. 573-580). I E E E, COMPUTER SOC PRESS.
https://doi.org/10.1109/EDTC.1997.582419Vancouver
Author
Bibtex
@inproceedings{0e08fc4683da45e0ac49dd75925e3036,
title = "A new quality estimation methodology for mixed-signal and analogue ICs",
abstract = "IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.",
author = "T Olbrich and Grout, {I A} and Aimine, {Y E} and Richardson, {A M} and J Contensou",
year = "1997",
doi = "10.1109/EDTC.1997.582419",
language = "English",
isbn = "0-8186-7786-4",
pages = "573--580",
booktitle = "European Design and Test Conference, 1997. ED&TC 97. Proceedings",
publisher = "I E E E, COMPUTER SOC PRESS",
}
RIS
TY - GEN
T1 - A new quality estimation methodology for mixed-signal and analogue ICs
AU - Olbrich, T
AU - Grout, I A
AU - Aimine, Y E
AU - Richardson, A M
AU - Contensou, J
PY - 1997
Y1 - 1997
N2 - IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.
AB - IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.
U2 - 10.1109/EDTC.1997.582419
DO - 10.1109/EDTC.1997.582419
M3 - Conference contribution/Paper
SN - 0-8186-7786-4
SP - 573
EP - 580
BT - European Design and Test Conference, 1997. ED&TC 97. Proceedings
PB - I E E E, COMPUTER SOC PRESS
CY - LOS ALAMITOS
ER -
