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Motivations and techniques of built in self-tes...
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School of Engineering
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Engineering of Microwaves, Terahertz and Light (E-MIT)
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Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.
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Contribution in Book/Report/Proceedings - With ISBN/ISSN
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Overview
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M. Burbidge
A. Lechner
G. Bell
Andrew M. D. Richardson
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Publication date
2004
Host publication
IEE proceedings - circuits, devices and systems
Pages
337-348
Number of pages
12
Volume
151
Edition
4
<mark>Original language</mark>
English