Home > Research > Publications & Outputs > Motivations and techniques of built in self-tes...
View graph of relations

Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Published

Standard

Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. / Burbidge, M.; Lechner, A.; Bell, G. et al.
IEE proceedings - circuits, devices and systems. Vol. 151 4. ed. 2004. p. 337-348.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter

Harvard

Burbidge, M, Lechner, A, Bell, G & Richardson, AMD 2004, Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. in IEE proceedings - circuits, devices and systems. 4 edn, vol. 151, pp. 337-348.

APA

Burbidge, M., Lechner, A., Bell, G., & Richardson, A. M. D. (2004). Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. In IEE proceedings - circuits, devices and systems (4 ed., Vol. 151, pp. 337-348)

Vancouver

Burbidge M, Lechner A, Bell G, Richardson AMD. Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. In IEE proceedings - circuits, devices and systems. 4 ed. Vol. 151. 2004. p. 337-348

Author

Burbidge, M. ; Lechner, A. ; Bell, G. et al. / Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. IEE proceedings - circuits, devices and systems. Vol. 151 4. ed. 2004. pp. 337-348

Bibtex

@inbook{3a2b72d9319945ea983c30abbc0d04bd,
title = "Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.",
author = "M. Burbidge and A. Lechner and G. Bell and Richardson, {Andrew M. D.}",
year = "2004",
language = "English",
volume = "151",
pages = "337--348",
booktitle = "IEE proceedings - circuits, devices and systems",
edition = "4",

}

RIS

TY - CHAP

T1 - Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

AU - Burbidge, M.

AU - Lechner, A.

AU - Bell, G.

AU - Richardson, Andrew M. D.

PY - 2004

Y1 - 2004

M3 - Chapter

VL - 151

SP - 337

EP - 348

BT - IEE proceedings - circuits, devices and systems

ER -