Standard
Harvard
Burbidge, M, Lechner, A, Bell, G
& Richardson, AMD 2004,
Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. in
IEE proceedings - circuits, devices and systems. 4 edn, vol. 151, pp. 337-348.
APA
Burbidge, M., Lechner, A., Bell, G.
, & Richardson, A. M. D. (2004).
Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. In
IEE proceedings - circuits, devices and systems (4 ed., Vol. 151, pp. 337-348)
Vancouver
Author
Bibtex
@inbook{3a2b72d9319945ea983c30abbc0d04bd,
title = "Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.",
author = "M. Burbidge and A. Lechner and G. Bell and Richardson, {Andrew M. D.}",
year = "2004",
language = "English",
volume = "151",
pages = "337--348",
booktitle = "IEE proceedings - circuits, devices and systems",
edition = "4",
}
RIS
TY - CHAP
T1 - Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.
AU - Burbidge, M.
AU - Lechner, A.
AU - Bell, G.
AU - Richardson, Andrew M. D.
PY - 2004
Y1 - 2004
M3 - Chapter
VL - 151
SP - 337
EP - 348
BT - IEE proceedings - circuits, devices and systems
ER -