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Towards a better understanding of failure modes...
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School of Engineering
Associated organisational unit
Engineering of Microwaves, Terahertz and Light (E-MIT)
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Towards a better understanding of failure modes and test requirements of ADCs.
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Contribution in Book/Report/Proceedings - With ISBN/ISSN
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Chapter
Published
Overview
Cite this
A. Lechner
Andrew M. D. Richardson
B. Hermes
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Publication date
2001
Host publication
Proceedings of a conference: automation and test in Europe (DATE ’01)
Pages
803
<mark>Original language</mark>
English