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School of Engineering

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Engineering of Microwaves, Terahertz and Light (E-MIT)

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Towards a better understanding of failure modes and test requirements of ADCs.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

A. Lechner
Andrew M. D. Richardson
B. Hermes

Publication date	2001
Host publication	Proceedings of a conference: automation and test in Europe (DATE ’01)
Pages	803
<mark>Original language</mark>	English