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Defect oriented test development based on inductive fault analysis

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

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Defect oriented test development based on inductive fault analysis. / Richardson, Andrew; Kerkhoff, H G ; Harvey, Russell.
1995. 2-11 Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France.

Research output: Contribution to conference - Without ISBN/ISSN › Conference paper

Harvard

Richardson, A, Kerkhoff, HG & Harvey, R 1995, 'Defect oriented test development based on inductive fault analysis', Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France, 20/06/95 - 22/06/95 pp. 2-11.

APA

Richardson, A., Kerkhoff, H. G., & Harvey, R. (1995). Defect oriented test development based on inductive fault analysis. 2-11. Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France.

Vancouver

Richardson A, Kerkhoff HG, Harvey R. Defect oriented test development based on inductive fault analysis. 1995. Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France.

Author

Richardson, Andrew ; Kerkhoff, H G ; Harvey, Russell. / Defect oriented test development based on inductive fault analysis. Paper presented at IEEE International Mixed Signal Test Workshop, Vilard de Larns, France.10 p.

Bibtex

@conference{2bb6ded606fe402ca73982fd08908993,
title = "Defect oriented test development based on inductive fault analysis",
abstract = "This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.",
keywords = "defect oriented test, mixed signal test, analogue test",
author = "Andrew Richardson and Kerkhoff, {H G} and Russell Harvey",
year = "1995",
month = jun,
day = "22",
language = "English",
pages = "2--11",
note = "IEEE International Mixed Signal Test Workshop ; Conference date: 20-06-1995 Through 22-06-1995",

}

RIS

TY - CONF

T1 - Defect oriented test development based on inductive fault analysis

AU - Richardson, Andrew

AU - Kerkhoff, H G

AU - Harvey, Russell

PY - 1995/6/22

Y1 - 1995/6/22

N2 - This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.

AB - This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.

KW - defect oriented test

KW - mixed signal test

KW - analogue test

M3 - Conference paper

SP - 2

EP - 11

T2 - IEEE International Mixed Signal Test Workshop

Y2 - 20 June 1995 through 22 June 1995

ER -