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Research output: Contribution to conference - Without ISBN/ISSN › Conference paper
Research output: Contribution to conference - Without ISBN/ISSN › Conference paper
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TY - CONF
T1 - Defect oriented test development based on inductive fault analysis
AU - Richardson, Andrew
AU - Kerkhoff, H G
AU - Harvey, Russell
PY - 1995/6/22
Y1 - 1995/6/22
N2 - This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.
AB - This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.
KW - defect oriented test
KW - mixed signal test
KW - analogue test
M3 - Conference paper
SP - 2
EP - 11
T2 - IEEE International Mixed Signal Test Workshop
Y2 - 20 June 1995 through 22 June 1995
ER -