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Designing reliable digital molecular electronic circuits.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paper



Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.