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Designing reliable digital molecular electronic circuits.

Research output: Contribution in Book/Report/ProceedingsPaper

Published

Publication date2009
Host publicationNano-Net 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings
EditorsAlexandre Schmid, Sanjay Goel, Wei Wang, Valeriu Beiu, Sandro Carrara
Place of publicationBerlin
PublisherSpringer
Pages111-115
Number of pages5
ISBN (Print)978-3-642-04849-4
Original languageEnglish

Publication series

NameLecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering
PublisherSpringer

Abstract

Reliability is expected to be a critical challenge in designing future molecular electronic circuits. Using a compact model that captures the essential physics of the device, the effect on digital gate functionality of variations in the device parameters, as well as the improvements afforded by a TMR majority gate structure are quantified. It is shown that the improvement is substantial, showing the potential viability of such technologies in future massively integrated systems.