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Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells

Research output: Contribution to journalJournal article

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Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells. / Longacre, Alexandra; Martin, Michael; Moran, Thomas; Kolosov, Oleg; Schneller, Eric ; Curran, Alan J. ; Wang, Menghong ; Dai, Jianfang ; Bruckman, Laura S. ; Jaubert, Jean-Nicolas; Davis, Kristopher O. ; Braid, Jennifer L. ; French, Roger H.; Huey, Bryan.

In: Journal of Materials Science, Vol. 55, No. 25, 01.09.2020, p. 11501-11511.

Research output: Contribution to journalJournal article

Harvard

Longacre, A, Martin, M, Moran, T, Kolosov, O, Schneller, E, Curran, AJ, Wang, M, Dai, J, Bruckman, LS, Jaubert, J-N, Davis, KO, Braid, JL, French, RH & Huey, B 2020, 'Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells', Journal of Materials Science, vol. 55, no. 25, pp. 11501-11511. https://doi.org/10.1007/s10853-020-04736-x

APA

Longacre, A., Martin, M., Moran, T., Kolosov, O., Schneller, E., Curran, A. J., Wang, M., Dai, J., Bruckman, L. S., Jaubert, J-N., Davis, K. O., Braid, J. L., French, R. H., & Huey, B. (2020). Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells. Journal of Materials Science, 55(25), 11501-11511. https://doi.org/10.1007/s10853-020-04736-x

Vancouver

Longacre A, Martin M, Moran T, Kolosov O, Schneller E, Curran AJ et al. Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells. Journal of Materials Science. 2020 Sep 1;55(25):11501-11511. https://doi.org/10.1007/s10853-020-04736-x

Author

Longacre, Alexandra ; Martin, Michael ; Moran, Thomas ; Kolosov, Oleg ; Schneller, Eric ; Curran, Alan J. ; Wang, Menghong ; Dai, Jianfang ; Bruckman, Laura S. ; Jaubert, Jean-Nicolas ; Davis, Kristopher O. ; Braid, Jennifer L. ; French, Roger H. ; Huey, Bryan. / Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells. In: Journal of Materials Science. 2020 ; Vol. 55, No. 25. pp. 11501-11511.

Bibtex

@article{002e3db2b35645d79d6d29cd9dde3ce3,
title = "Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells",
abstract = "The open circuit voltage (VOC) is a critical and common indicator of solar cell performance as well as degradation, for panel down to lab-scale photovoltaics. Detecting VOC at the nanoscale is much more challenging, however, due to experimental limitations on spatial resolution, voltage resolution, and/or measurement times. Accordingly, an approach based on Conductive Atomic Force Microscopy is implemented to directly detect the local VOC, notably for monocrystalline Passivated Emitter Rear Contact (PERC) cells which are the most common industrial-scale solar panel technology in production worldwide. This is demonstrated with cross-sectioned monocrystalline PERC cells around the entire circumference of a poly-aluminum-silicide via through the rear emitter. The VOC maps reveal a local back surface field extending * 2 lm into the underlying p-type Si absorber due to Al in-diffusion as designed. Such high spatial resolution methods for photovoltaic performance mapping are especially promising for directly visualizing the effects of processing parameters, as well as identifying signatures of degradation for silicon and other solar cell technologies.",
keywords = "BEXP, cross sectional polishing, beam exit cross-sectional polishing, Scanning probe microscopy, SSRM, AFM, solar cells, 3D, three dimensional",
author = "Alexandra Longacre and Michael Martin and Thomas Moran and Oleg Kolosov and Eric Schneller and Curran, {Alan J.} and Menghong Wang and Jianfang Dai and Bruckman, {Laura S.} and Jean-Nicolas Jaubert and Davis, {Kristopher O.} and Braid, {Jennifer L.} and French, {Roger H.} and Bryan Huey",
note = "The final publication is available at Springer via http://dx.doi.org/10.1007/s10853-020-04736-x",
year = "2020",
month = sep,
day = "1",
doi = "10.1007/s10853-020-04736-x",
language = "English",
volume = "55",
pages = "11501--11511",
journal = "Journal of Materials Science",
issn = "0022-2461",
publisher = "Springer Netherlands",
number = "25",

}

RIS

TY - JOUR

T1 - Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells

AU - Longacre, Alexandra

AU - Martin, Michael

AU - Moran, Thomas

AU - Kolosov, Oleg

AU - Schneller, Eric

AU - Curran, Alan J.

AU - Wang, Menghong

AU - Dai, Jianfang

AU - Bruckman, Laura S.

AU - Jaubert, Jean-Nicolas

AU - Davis, Kristopher O.

AU - Braid, Jennifer L.

AU - French, Roger H.

AU - Huey, Bryan

N1 - The final publication is available at Springer via http://dx.doi.org/10.1007/s10853-020-04736-x

PY - 2020/9/1

Y1 - 2020/9/1

N2 - The open circuit voltage (VOC) is a critical and common indicator of solar cell performance as well as degradation, for panel down to lab-scale photovoltaics. Detecting VOC at the nanoscale is much more challenging, however, due to experimental limitations on spatial resolution, voltage resolution, and/or measurement times. Accordingly, an approach based on Conductive Atomic Force Microscopy is implemented to directly detect the local VOC, notably for monocrystalline Passivated Emitter Rear Contact (PERC) cells which are the most common industrial-scale solar panel technology in production worldwide. This is demonstrated with cross-sectioned monocrystalline PERC cells around the entire circumference of a poly-aluminum-silicide via through the rear emitter. The VOC maps reveal a local back surface field extending * 2 lm into the underlying p-type Si absorber due to Al in-diffusion as designed. Such high spatial resolution methods for photovoltaic performance mapping are especially promising for directly visualizing the effects of processing parameters, as well as identifying signatures of degradation for silicon and other solar cell technologies.

AB - The open circuit voltage (VOC) is a critical and common indicator of solar cell performance as well as degradation, for panel down to lab-scale photovoltaics. Detecting VOC at the nanoscale is much more challenging, however, due to experimental limitations on spatial resolution, voltage resolution, and/or measurement times. Accordingly, an approach based on Conductive Atomic Force Microscopy is implemented to directly detect the local VOC, notably for monocrystalline Passivated Emitter Rear Contact (PERC) cells which are the most common industrial-scale solar panel technology in production worldwide. This is demonstrated with cross-sectioned monocrystalline PERC cells around the entire circumference of a poly-aluminum-silicide via through the rear emitter. The VOC maps reveal a local back surface field extending * 2 lm into the underlying p-type Si absorber due to Al in-diffusion as designed. Such high spatial resolution methods for photovoltaic performance mapping are especially promising for directly visualizing the effects of processing parameters, as well as identifying signatures of degradation for silicon and other solar cell technologies.

KW - BEXP

KW - cross sectional polishing

KW - beam exit cross-sectional polishing

KW - Scanning probe microscopy

KW - SSRM

KW - AFM

KW - solar cells

KW - 3D

KW - three dimensional

U2 - 10.1007/s10853-020-04736-x

DO - 10.1007/s10853-020-04736-x

M3 - Journal article

VL - 55

SP - 11501

EP - 11511

JO - Journal of Materials Science

JF - Journal of Materials Science

SN - 0022-2461

IS - 25

ER -