Home > Research > Publications & Outputs > Effect of low nitrogen concentrations on the el...

Associated organisational unit

View graph of relations

Effect of low nitrogen concentrations on the electronic properties of InAs1-xNx.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Published

Standard

Effect of low nitrogen concentrations on the electronic properties of InAs1-xNx. / Patane, A; Feu, W. H. M.; Makarovsky, O. et al.
In: Physical review B, Vol. 80, No. 11, 16.09.2009, p. 115207.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Patane, A, Feu, WHM, Makarovsky, O, Drachenko, O, Eaves, L, Krier, A, Zhuang, QD, Helm, M, Goiran, M & Hill, G 2009, 'Effect of low nitrogen concentrations on the electronic properties of InAs1-xNx.', Physical review B, vol. 80, no. 11, pp. 115207. https://doi.org/10.1103/PhysRevB.80.115207

APA

Patane, A., Feu, W. H. M., Makarovsky, O., Drachenko, O., Eaves, L., Krier, A., Zhuang, Q. D., Helm, M., Goiran, M., & Hill, G. (2009). Effect of low nitrogen concentrations on the electronic properties of InAs1-xNx. Physical review B, 80(11), 115207. https://doi.org/10.1103/PhysRevB.80.115207

Vancouver

Patane A, Feu WHM, Makarovsky O, Drachenko O, Eaves L, Krier A et al. Effect of low nitrogen concentrations on the electronic properties of InAs1-xNx. Physical review B. 2009 Sept 16;80(11):115207. doi: 10.1103/PhysRevB.80.115207

Author

Patane, A ; Feu, W. H. M. ; Makarovsky, O. et al. / Effect of low nitrogen concentrations on the electronic properties of InAs1-xNx. In: Physical review B. 2009 ; Vol. 80, No. 11. pp. 115207.

Bibtex

@article{4ef14db406ba45dcb9e8db6652a6a5a8,
title = "Effect of low nitrogen concentrations on the electronic properties of InAs1-xNx.",
abstract = "We report cyclotron resonance (CR), transverse magnetoresistance (MR), and Hall effect studies of a series of n-type InAs1−xNx epilayers grown on GaAs with x up to 1%. The well-resolved CR absorption lines, the classical linear MR, Shubnikov–de Haas magneto-oscillations, and negative MR revealed in our experiments provide a means of probing the effect of the N atoms on the electronic properties of this alloy system and reveal qualitative differences compared to the case of the wider gap III-N-V compounds, such as GaAs1−xNx. In GaAs1−xNx electron localization by N levels that are resonant with the extended band states of the host crystal act to degrade the electrical conductivity at small x (∼0.1%). These phenomena are significantly weaker in InAs1−xNx due to the smaller energy gap and higher energy of the N levels relative to the conduction band minimum. In InAs1−xNx the electrical conductivity retains the characteristic features of transport through extended states, with electron coherence lengths (lφ∼100 nm at 2 K) and electron mobilities (μ=6×103 cm2 V−1 s−1 at 300 K) that remain relatively large even at x=1%.",
author = "A Patane and Feu, {W. H. M.} and O. Makarovsky and O. Drachenko and L. Eaves and Anthony Krier and Zhuang, {Qian D.} and M. Helm and M. Goiran and G. Hill",
year = "2009",
month = sep,
day = "16",
doi = "10.1103/PhysRevB.80.115207",
language = "English",
volume = "80",
pages = "115207",
journal = "Physical review B",
issn = "1550-235X",
publisher = "AMER PHYSICAL SOC",
number = "11",

}

RIS

TY - JOUR

T1 - Effect of low nitrogen concentrations on the electronic properties of InAs1-xNx.

AU - Patane, A

AU - Feu, W. H. M.

AU - Makarovsky, O.

AU - Drachenko, O.

AU - Eaves, L.

AU - Krier, Anthony

AU - Zhuang, Qian D.

AU - Helm, M.

AU - Goiran, M.

AU - Hill, G.

PY - 2009/9/16

Y1 - 2009/9/16

N2 - We report cyclotron resonance (CR), transverse magnetoresistance (MR), and Hall effect studies of a series of n-type InAs1−xNx epilayers grown on GaAs with x up to 1%. The well-resolved CR absorption lines, the classical linear MR, Shubnikov–de Haas magneto-oscillations, and negative MR revealed in our experiments provide a means of probing the effect of the N atoms on the electronic properties of this alloy system and reveal qualitative differences compared to the case of the wider gap III-N-V compounds, such as GaAs1−xNx. In GaAs1−xNx electron localization by N levels that are resonant with the extended band states of the host crystal act to degrade the electrical conductivity at small x (∼0.1%). These phenomena are significantly weaker in InAs1−xNx due to the smaller energy gap and higher energy of the N levels relative to the conduction band minimum. In InAs1−xNx the electrical conductivity retains the characteristic features of transport through extended states, with electron coherence lengths (lφ∼100 nm at 2 K) and electron mobilities (μ=6×103 cm2 V−1 s−1 at 300 K) that remain relatively large even at x=1%.

AB - We report cyclotron resonance (CR), transverse magnetoresistance (MR), and Hall effect studies of a series of n-type InAs1−xNx epilayers grown on GaAs with x up to 1%. The well-resolved CR absorption lines, the classical linear MR, Shubnikov–de Haas magneto-oscillations, and negative MR revealed in our experiments provide a means of probing the effect of the N atoms on the electronic properties of this alloy system and reveal qualitative differences compared to the case of the wider gap III-N-V compounds, such as GaAs1−xNx. In GaAs1−xNx electron localization by N levels that are resonant with the extended band states of the host crystal act to degrade the electrical conductivity at small x (∼0.1%). These phenomena are significantly weaker in InAs1−xNx due to the smaller energy gap and higher energy of the N levels relative to the conduction band minimum. In InAs1−xNx the electrical conductivity retains the characteristic features of transport through extended states, with electron coherence lengths (lφ∼100 nm at 2 K) and electron mobilities (μ=6×103 cm2 V−1 s−1 at 300 K) that remain relatively large even at x=1%.

U2 - 10.1103/PhysRevB.80.115207

DO - 10.1103/PhysRevB.80.115207

M3 - Journal article

VL - 80

SP - 115207

JO - Physical review B

JF - Physical review B

SN - 1550-235X

IS - 11

ER -