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Fault-tolerant and self-testable architectures for zero failure electronics

Research output: Contribution in Book/Report/ProceedingsConference contribution

Published

Publication date1997
Host publicationAUTOMOTIVE ELECTRONICS - AUTOTECH'97
Place of publicationEDMUNDS
PublisherMECHANICAL ENGINEERING PUBL
Pages133-142
Number of pages10
ISBN (Print)1860581153 9781860581151
Original languageEnglish

Publication series

NameIMechE seminar publication ; 1997-10

Abstract

The introduction of new automotive system architectures that exploit the benefits offered by advanced electronic control will require the dependability of the electronic systems to be assured over the vehicle's life, This is particularly important in safety critical subsystems such as braking steering and ride control.

Improved processes, designs and minimal connector strategies are all contributing to these goals however, aggressive pricing and specifications are eliminating the possibilities of extensive reliability screening. In addition, degradation mechanisms and intermittent faults still occur in IC's despite radical improvements in processing technology. It is clear therefore that self test and diagnostic strategies are required in addition to techniques that guarantee high reliability levels if ZERO failure electronics is to be realised in modem automotive systems.

Bibliographic note

Autotech Congress, 4-6 November 1997, National Exhibition Centre, Birmingham, UK. Organized by the Automotive Division of the Institution of Mechanical Engineers