Fault-tolerant and self-testable architectures for zero failure electronics

School of Engineering

Associated organisational unit

Engineering of Microwaves, Terahertz and Light (E-MIT)

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Published

Standard

Fault-tolerant and self-testable architectures for zero failure electronics. / Richardson, A ; Sharif, E ; Betts, W R .
AUTOMOTIVE ELECTRONICS - AUTOTECH'97. EDMUNDS: MECHANICAL ENGINEERING PUBL, 1997. p. 133-142 (IMechE seminar publication ; 1997-10).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review

Harvard

Richardson, A, Sharif, E & Betts, WR 1997, Fault-tolerant and self-testable architectures for zero failure electronics. in AUTOMOTIVE ELECTRONICS - AUTOTECH'97. IMechE seminar publication ; 1997-10, MECHANICAL ENGINEERING PUBL, EDMUNDS, pp. 133-142.

APA

Richardson, A., Sharif, E., & Betts, W. R. (1997). Fault-tolerant and self-testable architectures for zero failure electronics. In AUTOMOTIVE ELECTRONICS - AUTOTECH'97 (pp. 133-142). (IMechE seminar publication ; 1997-10). MECHANICAL ENGINEERING PUBL.

Vancouver

Richardson A, Sharif E, Betts WR. Fault-tolerant and self-testable architectures for zero failure electronics. In AUTOMOTIVE ELECTRONICS - AUTOTECH'97. EDMUNDS: MECHANICAL ENGINEERING PUBL. 1997. p. 133-142. (IMechE seminar publication ; 1997-10).

Author

Richardson, A ; Sharif, E ; Betts, W R . / Fault-tolerant and self-testable architectures for zero failure electronics. AUTOMOTIVE ELECTRONICS - AUTOTECH'97. EDMUNDS : MECHANICAL ENGINEERING PUBL, 1997. pp. 133-142 (IMechE seminar publication ; 1997-10).

Bibtex

@inproceedings{9bfc48bef3994b9eb12a9c9ff097b87b,

title = "Fault-tolerant and self-testable architectures for zero failure electronics",

abstract = "The introduction of new automotive system architectures that exploit the benefits offered by advanced electronic control will require the dependability of the electronic systems to be assured over the vehicle's life, This is particularly important in safety critical subsystems such as braking steering and ride control.Improved processes, designs and minimal connector strategies are all contributing to these goals however, aggressive pricing and specifications are eliminating the possibilities of extensive reliability screening. In addition, degradation mechanisms and intermittent faults still occur in IC's despite radical improvements in processing technology. It is clear therefore that self test and diagnostic strategies are required in addition to techniques that guarantee high reliability levels if ZERO failure electronics is to be realised in modem automotive systems.",

author = "A Richardson and E Sharif and Betts, {W R}",

note = "Autotech Congress, 4-6 November 1997, National Exhibition Centre, Birmingham, UK. Organized by the Automotive Division of the Institution of Mechanical Engineers",

year = "1997",

language = "English",

isbn = "1860581153 9781860581151",

series = "IMechE seminar publication ; 1997-10",

publisher = "MECHANICAL ENGINEERING PUBL",

pages = "133--142",

booktitle = "AUTOMOTIVE ELECTRONICS - AUTOTECH'97",

}

RIS

TY - GEN

T1 - Fault-tolerant and self-testable architectures for zero failure electronics

AU - Richardson, A

AU - Sharif, E

AU - Betts, W R

N1 - Autotech Congress, 4-6 November 1997, National Exhibition Centre, Birmingham, UK. Organized by the Automotive Division of the Institution of Mechanical Engineers

PY - 1997

Y1 - 1997

N2 - The introduction of new automotive system architectures that exploit the benefits offered by advanced electronic control will require the dependability of the electronic systems to be assured over the vehicle's life, This is particularly important in safety critical subsystems such as braking steering and ride control.Improved processes, designs and minimal connector strategies are all contributing to these goals however, aggressive pricing and specifications are eliminating the possibilities of extensive reliability screening. In addition, degradation mechanisms and intermittent faults still occur in IC's despite radical improvements in processing technology. It is clear therefore that self test and diagnostic strategies are required in addition to techniques that guarantee high reliability levels if ZERO failure electronics is to be realised in modem automotive systems.

AB - The introduction of new automotive system architectures that exploit the benefits offered by advanced electronic control will require the dependability of the electronic systems to be assured over the vehicle's life, This is particularly important in safety critical subsystems such as braking steering and ride control.Improved processes, designs and minimal connector strategies are all contributing to these goals however, aggressive pricing and specifications are eliminating the possibilities of extensive reliability screening. In addition, degradation mechanisms and intermittent faults still occur in IC's despite radical improvements in processing technology. It is clear therefore that self test and diagnostic strategies are required in addition to techniques that guarantee high reliability levels if ZERO failure electronics is to be realised in modem automotive systems.

M3 - Conference contribution/Paper

SN - 1860581153 9781860581151

T3 - IMechE seminar publication ; 1997-10

SP - 133

EP - 142

BT - AUTOMOTIVE ELECTRONICS - AUTOTECH'97

PB - MECHANICAL ENGINEERING PUBL

CY - EDMUNDS

ER -

Research

Associated organisational unit