Research output: Contribution to Journal/Magazine › Journal article
Research output: Contribution to Journal/Magazine › Journal article
}
TY - JOUR
T1 - Flexible embedded test solution for high-speed analogue front-end architectures.
AU - Lechner, A.
AU - Burbidge, Martin J.
AU - Richardson, Andrew M. D.
N1 - "©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."
PY - 2004
Y1 - 2004
N2 - A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.
AB - A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.
U2 - 10.1049/ip-cds:20040557
DO - 10.1049/ip-cds:20040557
M3 - Journal article
VL - 151
SP - 359
EP - 369
JO - IEE Proceedings - Circuits, Devices and Systems
JF - IEE Proceedings - Circuits, Devices and Systems
SN - 1350-2409
IS - 4
ER -