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Flexible embedded test solution for high-speed analogue front-end architectures.

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Flexible embedded test solution for high-speed analogue front-end architectures. / Lechner, A.; Burbidge, Martin J.; Richardson, Andrew M. D.
In: IEE Proceedings - Circuits, Devices and Systems, Vol. 151, No. 4, 2004, p. 359-369.

Research output: Contribution to Journal/Magazine › Journal article

Harvard

Lechner, A, Burbidge, MJ & Richardson, AMD 2004, 'Flexible embedded test solution for high-speed analogue front-end architectures.', IEE Proceedings - Circuits, Devices and Systems, vol. 151, no. 4, pp. 359-369. https://doi.org/10.1049/ip-cds:20040557

APA

Lechner, A., Burbidge, M. J., & Richardson, A. M. D. (2004). Flexible embedded test solution for high-speed analogue front-end architectures. IEE Proceedings - Circuits, Devices and Systems, 151(4), 359-369. https://doi.org/10.1049/ip-cds:20040557

Vancouver

Lechner A, Burbidge MJ, Richardson AMD. Flexible embedded test solution for high-speed analogue front-end architectures. IEE Proceedings - Circuits, Devices and Systems. 2004;151(4):359-369. doi: 10.1049/ip-cds:20040557

Author

Lechner, A. ; Burbidge, Martin J. ; Richardson, Andrew M. D. / Flexible embedded test solution for high-speed analogue front-end architectures. In: IEE Proceedings - Circuits, Devices and Systems. 2004 ; Vol. 151, No. 4. pp. 359-369.

Bibtex

@article{822b5a3870c9493fa01c20222a3fe555,
title = "Flexible embedded test solution for high-speed analogue front-end architectures.",
abstract = "A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.",
author = "A. Lechner and Burbidge, {Martin J.} and Richardson, {Andrew M. D.}",
note = "{"}{\textcopyright}2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.{"} {"}This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.{"}",
year = "2004",
doi = "10.1049/ip-cds:20040557",
language = "English",
volume = "151",
pages = "359--369",
journal = "IEE Proceedings - Circuits, Devices and Systems",
issn = "1350-2409",
publisher = "Institute of Electrical Engineers",
number = "4",

}

RIS

TY - JOUR

T1 - Flexible embedded test solution for high-speed analogue front-end architectures.

AU - Lechner, A.

AU - Burbidge, Martin J.

AU - Richardson, Andrew M. D.

N1 - "©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE." "This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder."

PY - 2004

Y1 - 2004

N2 - A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.

AB - A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.

U2 - 10.1049/ip-cds:20040557

DO - 10.1049/ip-cds:20040557

M3 - Journal article

VL - 151

SP - 359

EP - 369

JO - IEE Proceedings - Circuits, Devices and Systems

JF - IEE Proceedings - Circuits, Devices and Systems

SN - 1350-2409

IS - 4

ER -