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Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
}
TY - GEN
T1 - Graphene Conductivity Mapping using Terahertz Time-Domain Reflection Spectroscopy
AU - Lin, H.
AU - Braeuninzer-Weimer, P.
AU - Kamboi, V. S.
AU - Jessop, D. S.
AU - Degl'Innoccenti, R.
AU - Beere, H. E.
AU - Ritchie, D. A.
AU - Hofmann, S.
AU - Zeitler, J. A.
N1 - ©2018 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
PY - 2018/10/29
Y1 - 2018/10/29
N2 - Graphene conductivity mapping was successfully demonstrated using terahertz time-domain spectroscopy (THz-TDS) operating in transmission geometry. In order to cater for a greater range of substrates and scenarios where transmission geometry becomes prohibitive, here we demonstrate conductivity mapping of large area chemical vapor deposited (CVD) graphene films on sapphire. We validate the technique against measurements performed using the transmission based THz- TDS.
AB - Graphene conductivity mapping was successfully demonstrated using terahertz time-domain spectroscopy (THz-TDS) operating in transmission geometry. In order to cater for a greater range of substrates and scenarios where transmission geometry becomes prohibitive, here we demonstrate conductivity mapping of large area chemical vapor deposited (CVD) graphene films on sapphire. We validate the technique against measurements performed using the transmission based THz- TDS.
KW - chemical vapour deposition
KW - electrical conductivity
KW - graphene
KW - terahertz wave spectra
KW - thin films
KW - transmission geometry
KW - graphene conductivity mapping
KW - terahertz time-domain reflection spectroscopy
KW - chemical vapor deposited graphene films
KW - C
KW - Al2O3
KW - Graphene
KW - Conductivity
KW - Reflection
KW - Substrates
KW - Geometry
KW - Conductivity measurement
KW - Films
U2 - 10.1109/IRMMW-THz.2018.8509899
DO - 10.1109/IRMMW-THz.2018.8509899
M3 - Conference contribution/Paper
SP - 1
EP - 2
BT - 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
PB - IEEE
ER -