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High throughput mechanical property testing of materials libraries using a piezoelectric

Research output: Patent

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High throughput mechanical property testing of materials libraries using a piezoelectric. / Hajduk, Damian (Inventor); Carlson, Eric (Inventor); Freitag, Christopher (Inventor) et al.
Patent No.: US 2004/0113602 A1. Jun 17, 2004.

Research output: Patent

Harvard

Hajduk, D, Carlson, E, Freitag, C, Kolosov, O, Engstrom, J, Safir, A, Shrinivasan, R & Matsiev, L Jun. 17 2004, High throughput mechanical property testing of materials libraries using a piezoelectric, Patent No. US 2004/0113602 A1.

APA

Hajduk, D., Carlson, E., Freitag, C., Kolosov, O., Engstrom, J., Safir, A., Shrinivasan, R., & Matsiev, L. (2004). High throughput mechanical property testing of materials libraries using a piezoelectric. (Patent No. US 2004/0113602 A1).

Vancouver

Hajduk D, Carlson E, Freitag C, Kolosov O, Engstrom J, Safir A et al., inventors. High throughput mechanical property testing of materials libraries using a piezoelectric. US 2004/0113602 A1. 2004 Jun 17.

Author

Hajduk, Damian (Inventor) ; Carlson, Eric (Inventor) ; Freitag, Christopher (Inventor) et al. / High throughput mechanical property testing of materials libraries using a piezoelectric. Patent No.: US 2004/0113602 A1. Jun 17, 2004.

Bibtex

@misc{064335b26bb94e28a047bc7b47808061,
title = "High throughput mechanical property testing of materials libraries using a piezoelectric",
abstract = "The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford fa{"}Ster sample loading and unloading, for example, through the use of disposable libraries of material samples.",
keywords = "high throughput screening, combinatorial materials discovery, polymers, films, mechanical property, parallel measurements",
author = "Damian Hajduk and Eric Carlson and Christopher Freitag and Oleg Kolosov and James Engstrom and Adam Safir and Ravi Shrinivasan and L Matsiev",
year = "2004",
month = jun,
day = "17",
language = "English",
type = "Patent",
note = "US 2004/0113602 A1; GOIN 3/10,3/36",

}

RIS

TY - PAT

T1 - High throughput mechanical property testing of materials libraries using a piezoelectric

AU - Hajduk, Damian

AU - Carlson, Eric

AU - Freitag, Christopher

AU - Kolosov, Oleg

AU - Engstrom, James

AU - Safir, Adam

AU - Shrinivasan, Ravi

AU - Matsiev, L

PY - 2004/6/17

Y1 - 2004/6/17

N2 - The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford fa"Ster sample loading and unloading, for example, through the use of disposable libraries of material samples.

AB - The present invention provides instruments and methods for screening combinatorial libraries that addresses many of the problems encountered when using conventional instruments. For example, the disclosed instruments can measure mechanical properties of library members in rapid serial or parallel test format, and can perform tests on small amounts of material, which are easily prepared or dispensed using art-disclosed liquid or solid handling techniques. Compared to conventional instruments, the disclosed instruments afford fa"Ster sample loading and unloading, for example, through the use of disposable libraries of material samples.

KW - high throughput screening

KW - combinatorial materials discovery

KW - polymers

KW - films

KW - mechanical property

KW - parallel measurements

M3 - Patent

M1 - US 2004/0113602 A1

ER -