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  • wavelet_charge_sensing_2015

    Rights statement: This is an author-created, un-copyedited version of an article accepted for publication/published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi:10.1088/0957-4484/26/21/215201. © 2015 IOP Publishing

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Identifying single electron charge sensor events using wavelet edge detection

Research output: Contribution to journalJournal article

Published
  • Jonathan Prance
  • B. J. Van Bael
  • C. B. Simmons
  • D. E. Savage
  • M. G. Lagally
  • Mark Friesen
  • S. N. Coppersmith
  • M. A. Eriksson
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Article number215201
<mark>Journal publication date</mark>1/05/2015
<mark>Journal</mark>Nanotechnology
Issue number21
Volume26
Number of pages6
Publication statusPublished
Original languageEnglish

Abstract

The operation of solid-state qubits often relies on single-shot readout using a nanoelectronic charge sensor, and the detection of events in a noisy sensor signal is crucial for high fidelity readout of such qubits. The most common detection scheme, comparing the signal to a threshold value, is accurate at low noise levels but is not robust to low-frequency noise and signal drift. We describe an alternative method for identifying charge sensor events using wavelet edge detection. The technique is convenient to use and we show that, with realistic signals and a single tunable parameter, wavelet detection can outperform thresholding and is significantly more tolerant to 1/f and low-frequency noise.

Bibliographic note

This is an author-created, un-copyedited version of an article accepted for publication/published in Nanotechnology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at doi:10.1088/0957-4484/26/21/215201. © 2015 IOP Publishing