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Klystron output cavity investigation using MAFIA

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Klystron output cavity investigation using MAFIA. / Feng, Jinjun; Carter, Richard G.
4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. p. 96-97 1286091 (4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings).

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paper

Harvard

Feng, J & Carter, RG 2003, Klystron output cavity investigation using MAFIA. in 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings., 1286091, 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 96-97, 4th IEEE International Vacuum Electronics Conference, IVEC 2003, Seoul, Korea, Republic of, 28/05/03. https://doi.org/10.1109/IVEC.2003.1286091

APA

Feng, J., & Carter, R. G. (2003). Klystron output cavity investigation using MAFIA. In 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings (pp. 96-97). Article 1286091 (4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVEC.2003.1286091

Vancouver

Feng J, Carter RG. Klystron output cavity investigation using MAFIA. In 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2003. p. 96-97. 1286091. (4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings). doi: 10.1109/IVEC.2003.1286091

Author

Feng, Jinjun ; Carter, Richard G. / Klystron output cavity investigation using MAFIA. 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2003. pp. 96-97 (4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings).

Bibtex

@inproceedings{ba6af499b1ee42aaa0751a88d0e0a003,
title = "Klystron output cavity investigation using MAFIA",
abstract = "In this presentation we study how cavity and bunch parameters affect the efficiency of power transfer from the bunches to the cavity and also provide verifying data for other models. The parameters of the klystron used in the investigation were beam power 2MW, beam voltage 100KV and beam current 20A giving a saturated efficiency around 65%.",
author = "Jinjun Feng and Carter, {Richard G.}",
year = "2003",
month = jan,
day = "1",
doi = "10.1109/IVEC.2003.1286091",
language = "English",
series = "4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "96--97",
booktitle = "4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings",
note = "4th IEEE International Vacuum Electronics Conference, IVEC 2003 ; Conference date: 28-05-2003 Through 30-05-2003",

}

RIS

TY - GEN

T1 - Klystron output cavity investigation using MAFIA

AU - Feng, Jinjun

AU - Carter, Richard G.

PY - 2003/1/1

Y1 - 2003/1/1

N2 - In this presentation we study how cavity and bunch parameters affect the efficiency of power transfer from the bunches to the cavity and also provide verifying data for other models. The parameters of the klystron used in the investigation were beam power 2MW, beam voltage 100KV and beam current 20A giving a saturated efficiency around 65%.

AB - In this presentation we study how cavity and bunch parameters affect the efficiency of power transfer from the bunches to the cavity and also provide verifying data for other models. The parameters of the klystron used in the investigation were beam power 2MW, beam voltage 100KV and beam current 20A giving a saturated efficiency around 65%.

U2 - 10.1109/IVEC.2003.1286091

DO - 10.1109/IVEC.2003.1286091

M3 - Conference contribution/Paper

AN - SCOPUS:84947790353

T3 - 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings

SP - 96

EP - 97

BT - 4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 4th IEEE International Vacuum Electronics Conference, IVEC 2003

Y2 - 28 May 2003 through 30 May 2003

ER -