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    Rights statement: This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Nano, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://pubs.acs.org/doi/10.1021/acsnano.8b04713

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Low-Frequency Noise in Graphene Tunnel Junctions

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Low-Frequency Noise in Graphene Tunnel Junctions. / Puczkarski, Paweł; Wu, Qingqing; Sadeghi, Hatef et al.
In: ACS Nano, Vol. 12, No. 9, 25.09.2018, p. 9451-9460.

Research output: Contribution to Journal/MagazineJournal articlepeer-review

Harvard

Puczkarski, P, Wu, Q, Sadeghi, H, Hou, S, Karimi, A, Sheng, Y, Warner, JH, Lambert, CJ, Briggs, GAD & Mol, JA 2018, 'Low-Frequency Noise in Graphene Tunnel Junctions', ACS Nano, vol. 12, no. 9, pp. 9451-9460. https://doi.org/10.1021/acsnano.8b04713

APA

Puczkarski, P., Wu, Q., Sadeghi, H., Hou, S., Karimi, A., Sheng, Y., Warner, J. H., Lambert, C. J., Briggs, G. A. D., & Mol, J. A. (2018). Low-Frequency Noise in Graphene Tunnel Junctions. ACS Nano, 12(9), 9451-9460. https://doi.org/10.1021/acsnano.8b04713

Vancouver

Puczkarski P, Wu Q, Sadeghi H, Hou S, Karimi A, Sheng Y et al. Low-Frequency Noise in Graphene Tunnel Junctions. ACS Nano. 2018 Sept 25;12(9):9451-9460. Epub 2018 Aug 16. doi: 10.1021/acsnano.8b04713

Author

Puczkarski, Paweł ; Wu, Qingqing ; Sadeghi, Hatef et al. / Low-Frequency Noise in Graphene Tunnel Junctions. In: ACS Nano. 2018 ; Vol. 12, No. 9. pp. 9451-9460.

Bibtex

@article{a0927c8fdb1f4ffbb9e25ef8df201c6d,
title = "Low-Frequency Noise in Graphene Tunnel Junctions",
abstract = "Graphene tunnel junctions are a promising experimental platform for single molecule electronics and biosensing. Ultimately their noise properties will play a critical role in developing these applications. Here we report a study of electrical noise in graphene tunnel junctions fabricated through feedback-controlled electroburning. We observe random telegraph signals characterized by a Lorentzian noise spectrum at cryogenic temperatures (77 K) and a 1/f noise spectrum at room temperature. To gain insight into the origin of these noise features, we introduce a theoretical model that couples a quantum mechanical tunnel barrier to one or more classical fluctuators. The fluctuators are identified as charge traps in the underlying dielectric, which through random fluctuations in their occupation introduce time-dependent modulations in the electrostatic environment that shift the potential barrier of the junction. Analysis of the experimental results and the tight-binding model indicate that the random trap occupation is governed by Poisson statistics. In the 35 devices measured at room temperature, we observe a 20–60% time-dependent variance of the current, which can be attributed to a relative potential barrier shift of between 6% and 10%. In 10 devices measured at 77 K, we observe a 10% time-dependent variance of the current, which can be attributed to a relative potential barrier shift of between 3% and 4%. Our measurements reveal a high sensitivity of the graphene tunnel junctions to their local electrostatic environment, with observable features of intertrap Coulomb interactions in the distribution of current switching amplitudes.",
author = "Pawe{\l} Puczkarski and Qingqing Wu and Hatef Sadeghi and Songjun Hou and Amin Karimi and Yuewen Sheng and Warner, {Jamie H.} and Lambert, {Colin J.} and Briggs, {G. Andrew D.} and Mol, {Jan A.}",
note = "This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Nano, copyright {\textcopyright} American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://pubs.acs.org/doi/10.1021/acsnano.8b04713",
year = "2018",
month = sep,
day = "25",
doi = "10.1021/acsnano.8b04713",
language = "English",
volume = "12",
pages = "9451--9460",
journal = "ACS Nano",
issn = "1936-0851",
publisher = "American Chemical Society",
number = "9",

}

RIS

TY - JOUR

T1 - Low-Frequency Noise in Graphene Tunnel Junctions

AU - Puczkarski, Paweł

AU - Wu, Qingqing

AU - Sadeghi, Hatef

AU - Hou, Songjun

AU - Karimi, Amin

AU - Sheng, Yuewen

AU - Warner, Jamie H.

AU - Lambert, Colin J.

AU - Briggs, G. Andrew D.

AU - Mol, Jan A.

N1 - This document is the Accepted Manuscript version of a Published Work that appeared in final form in ACS Nano, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see https://pubs.acs.org/doi/10.1021/acsnano.8b04713

PY - 2018/9/25

Y1 - 2018/9/25

N2 - Graphene tunnel junctions are a promising experimental platform for single molecule electronics and biosensing. Ultimately their noise properties will play a critical role in developing these applications. Here we report a study of electrical noise in graphene tunnel junctions fabricated through feedback-controlled electroburning. We observe random telegraph signals characterized by a Lorentzian noise spectrum at cryogenic temperatures (77 K) and a 1/f noise spectrum at room temperature. To gain insight into the origin of these noise features, we introduce a theoretical model that couples a quantum mechanical tunnel barrier to one or more classical fluctuators. The fluctuators are identified as charge traps in the underlying dielectric, which through random fluctuations in their occupation introduce time-dependent modulations in the electrostatic environment that shift the potential barrier of the junction. Analysis of the experimental results and the tight-binding model indicate that the random trap occupation is governed by Poisson statistics. In the 35 devices measured at room temperature, we observe a 20–60% time-dependent variance of the current, which can be attributed to a relative potential barrier shift of between 6% and 10%. In 10 devices measured at 77 K, we observe a 10% time-dependent variance of the current, which can be attributed to a relative potential barrier shift of between 3% and 4%. Our measurements reveal a high sensitivity of the graphene tunnel junctions to their local electrostatic environment, with observable features of intertrap Coulomb interactions in the distribution of current switching amplitudes.

AB - Graphene tunnel junctions are a promising experimental platform for single molecule electronics and biosensing. Ultimately their noise properties will play a critical role in developing these applications. Here we report a study of electrical noise in graphene tunnel junctions fabricated through feedback-controlled electroburning. We observe random telegraph signals characterized by a Lorentzian noise spectrum at cryogenic temperatures (77 K) and a 1/f noise spectrum at room temperature. To gain insight into the origin of these noise features, we introduce a theoretical model that couples a quantum mechanical tunnel barrier to one or more classical fluctuators. The fluctuators are identified as charge traps in the underlying dielectric, which through random fluctuations in their occupation introduce time-dependent modulations in the electrostatic environment that shift the potential barrier of the junction. Analysis of the experimental results and the tight-binding model indicate that the random trap occupation is governed by Poisson statistics. In the 35 devices measured at room temperature, we observe a 20–60% time-dependent variance of the current, which can be attributed to a relative potential barrier shift of between 6% and 10%. In 10 devices measured at 77 K, we observe a 10% time-dependent variance of the current, which can be attributed to a relative potential barrier shift of between 3% and 4%. Our measurements reveal a high sensitivity of the graphene tunnel junctions to their local electrostatic environment, with observable features of intertrap Coulomb interactions in the distribution of current switching amplitudes.

U2 - 10.1021/acsnano.8b04713

DO - 10.1021/acsnano.8b04713

M3 - Journal article

VL - 12

SP - 9451

EP - 9460

JO - ACS Nano

JF - ACS Nano

SN - 1936-0851

IS - 9

ER -