Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Conference contribution/Paper › peer-review
}
TY - GEN
T1 - Novel recombination lifetime mapping technique through Kelvin probe studies
AU - Alderman, Nicholas
AU - Danos, Lefteris
AU - Grossel, Martin
AU - Markvart, Tom
PY - 2013
Y1 - 2013
N2 - The Kelvin probe is a very powerful and versatile tool, allowing the extraction of data such as diffusion length, surface photovoltage and impurity concentrations. This paper investigates the extraction of surface recombination velocities (and assuming a bulk lifetime, the surface recombination lifetime) from the I-V type dependence of the sample. By using an X-Y stage, the surface recombination lifetime can be imaged for entire wafers, instead of obtaining an average value of lifetime similar to that obtained from the Sinton WCT-120 lifetime tool. This is useful in determining where further improvements in the surface passivation can be obtained, by observing problem areas in the passivation layer.
AB - The Kelvin probe is a very powerful and versatile tool, allowing the extraction of data such as diffusion length, surface photovoltage and impurity concentrations. This paper investigates the extraction of surface recombination velocities (and assuming a bulk lifetime, the surface recombination lifetime) from the I-V type dependence of the sample. By using an X-Y stage, the surface recombination lifetime can be imaged for entire wafers, instead of obtaining an average value of lifetime similar to that obtained from the Sinton WCT-120 lifetime tool. This is useful in determining where further improvements in the surface passivation can be obtained, by observing problem areas in the passivation layer.
U2 - 10.1109/PVSC.2013.6744132
DO - 10.1109/PVSC.2013.6744132
M3 - Conference contribution/Paper
SP - 209
EP - 211
BT - Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
PB - IEEE
T2 - Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Y2 - 16 June 2013 through 21 June 2013
ER -