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Test evaluation for complex mixed signal ICs by...
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School of Engineering
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Engineering of Microwaves, Terahertz and Light (E-MIT)
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Test evaluation for complex mixed signal ICs by introducing layout dependent faults.
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Contribution in Book/Report/Proceedings - With ISBN/ISSN
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Chapter
Published
Overview
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R. J. A. Harvey
A. M. D. Richardson
E. M. J. Bruls
K. Baker
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Publication date
1993
Host publication
Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240
Place of Publication
London
Pages
6/1-8
<mark>Original language</mark>
English