We have over 12,000 students, from over 100 countries, within one of the safest campuses in the UK


93% of Lancaster students go into work or further study within six months of graduating

Home > Research > Publications & Outputs > Test evaluation for complex mixed signal ICs by...
View graph of relations

« Back

Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

Research output: Contribution in Book/Report/ProceedingsChapter


Associated organisational unit

Publication date1993
Host publicationProceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240
Place of publicationLondon
Original languageEnglish