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Engineering of Microwaves, Terahertz and Light (E-MIT)

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Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter

Published

R. J. A. Harvey
A. M. D. Richardson
E. M. J. Bruls
K. Baker

Publication date	1993
Host publication	Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240
Place of Publication	London
Pages	6/1-8
<mark>Original language</mark>	English