Ultrasonic oscillation detecting method and sample observing method for interatomic rirce microscope

Physics

Electronic data

Patent
Final published version, 141 KB, PDF document

Keywords

Atomic force microscopy, nonlinearity, nanomechanics, nanotechnology

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Ultrasonic oscillation detecting method and sample observing method for interatomic rirce microscope. / Kolosov, Oleg (Inventor); YAMANAKA, K (Inventor); Watanabe, K. (Inventor).
Patent No.: JP6323843A. Nov 25, 1994.

Research output: Patent

Bibtex

@misc{55c0677182614486a63632bf1af8d135,

title = "Ultrasonic oscillation detecting method and sample observing method for interatomic rirce microscope",

abstract = "PURPOSE:To provide ultrasonic oscillation detecting method and sample observing method for interatomic force microscope in which the viscoelaslic properties and the like can be measured at a frequency higher than 1 MHz by generating ultrasonic oscillation of 1 MHz or above In a sample and detectng the ultrasonlc oscillation using a common cantilever. CONSTITlUTION:A sample 8 is subjected to ultrasonic oscillation at a frequency sufficiently higher than the resonance frequency of a cantilever 11. Since the force functioning between a probe 4 and the sample 8 exibit nonlinear dependency on the distance, a displacement depending on the amplitude of oscillation Is Induced In the cantilever 11. Ultrasonic wave is detected by measuring the displacement.",

keywords = "Atomic force microscopy, nonlinearity, nanomechanics, nanotechnology",

author = "Oleg Kolosov and K YAMANAKA and K. Watanabe",

year = "1994",

month = nov,

day = "25",

language = "Other",

type = "Patent",

note = "JP6323843A; G01B21/30; G01N29/00",

}

RIS

TY - PAT

T1 - Ultrasonic oscillation detecting method and sample observing method for interatomic rirce microscope

AU - Kolosov, Oleg

AU - YAMANAKA, K

AU - Watanabe, K.

PY - 1994/11/25

Y1 - 1994/11/25

N2 - PURPOSE:To provide ultrasonic oscillation detecting method and sample observing method for interatomic force microscope in which the viscoelaslic properties and the like can be measured at a frequency higher than 1 MHz by generating ultrasonic oscillation of 1 MHz or above In a sample and detectng the ultrasonlc oscillation using a common cantilever. CONSTITlUTION:A sample 8 is subjected to ultrasonic oscillation at a frequency sufficiently higher than the resonance frequency of a cantilever 11. Since the force functioning between a probe 4 and the sample 8 exibit nonlinear dependency on the distance, a displacement depending on the amplitude of oscillation Is Induced In the cantilever 11. Ultrasonic wave is detected by measuring the displacement.

AB - PURPOSE:To provide ultrasonic oscillation detecting method and sample observing method for interatomic force microscope in which the viscoelaslic properties and the like can be measured at a frequency higher than 1 MHz by generating ultrasonic oscillation of 1 MHz or above In a sample and detectng the ultrasonlc oscillation using a common cantilever. CONSTITlUTION:A sample 8 is subjected to ultrasonic oscillation at a frequency sufficiently higher than the resonance frequency of a cantilever 11. Since the force functioning between a probe 4 and the sample 8 exibit nonlinear dependency on the distance, a displacement depending on the amplitude of oscillation Is Induced In the cantilever 11. Ultrasonic wave is detected by measuring the displacement.

KW - Atomic force microscopy

KW - nonlinearity

KW - nanomechanics

KW - nanotechnology

M3 - Patent

M1 - JP6323843A

ER -

Research

Electronic data

Keywords