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Ultra-thin silicon solar cell: Modelling and characterisation

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<mark>Journal publication date</mark>05/2008
<mark>Journal</mark>Physica Status Solidi C
Issue number5
Volume5
Number of pages4
Pages (from-to)1407-1410
Publication statusPublished
Original languageEnglish
Event4th International Conference on Spectroscopic Ellipsometry (ICSE-4) - Stockholm, Sweden
Duration: 11/06/200715/06/2007

Conference

Conference4th International Conference on Spectroscopic Ellipsometry (ICSE-4)
CountrySweden
CityStockholm
Period11/06/0715/06/07

Abstract

An ultra-thin crystalline silicon solar cell with an active silicon layer of 200 nm has been fabricated and fully characterised (I-V characteristic, spectral response) and optically (Variable Angle Spectroscopic Ellipsometry). Interference effects were observed in the spectral response of the cell due to multiple reflections from the layers within the cell. A mathematical model was developed to account for the different reflections and transmission within the cell which reproduced excellently the essential features of the experimental spectral response.