TY - JOUR

T1 - Ultra-thin silicon solar cell: Modelling and characterisation

AU - Danos, L.

AU - Jones, G.

AU - Greef, R.

AU - Markvart, T.

PY - 2008/5

Y1 - 2008/5

N2 - An ultra-thin crystalline silicon solar cell with an active silicon layer of 200 nm has been fabricated and fully characterised (I-V characteristic, spectral response) and optically (Variable Angle Spectroscopic Ellipsometry). Interference effects were observed in the spectral response of the cell due to multiple reflections from the layers within the cell. A mathematical model was developed to account for the different reflections and transmission within the cell which reproduced excellently the essential features of the experimental spectral response.

AB - An ultra-thin crystalline silicon solar cell with an active silicon layer of 200 nm has been fabricated and fully characterised (I-V characteristic, spectral response) and optically (Variable Angle Spectroscopic Ellipsometry). Interference effects were observed in the spectral response of the cell due to multiple reflections from the layers within the cell. A mathematical model was developed to account for the different reflections and transmission within the cell which reproduced excellently the essential features of the experimental spectral response.

KW - ENERGY-TRANSFER

U2 - 10.1002/pssc.200777809

DO - 10.1002/pssc.200777809

M3 - Journal article

VL - 5

SP - 1407

EP - 1410

JO - Physica Status Solidi C

JF - Physica Status Solidi C

SN - 1610-1634

IS - 5

T2 - 4th International Conference on Spectroscopic Ellipsometry (ICSE-4)

Y2 - 11 June 2007 through 15 June 2007

ER -