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Results for BEXP

Publications & Outputs

  1. Quantifying thermal transport in buried semiconductor nanostructures via Cross-Sectional Scanning Thermal Microscopy

    Spiece, J., Evangeli, C., Robson, A., Sachat, A., Hanel, L., Alonso, M., Garriga, M., Robinson, B., Oehme, M., Schulze, J., Alzina, F., Sotomayor-Torres, C. M. & Kolosov, O., 28/06/2021, In: Nanoscale. 13, 24, p. 10829-10836 8 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  2. Complementary sample preparation strategies (PVD/BEXP) combining with multifunctional SPM for the characterizations of battery interfacial properties

    Pan, H., Chen, Y., Pang, W., Sun, H., Li, J., Lin, Y., Kolosov, O. & Huang, Z., 1/02/2021, In: MethodsX. 8, 12 p., 101250.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  3. Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells

    Longacre, A., Martin, M., Moran, T., Kolosov, O., Schneller, E., Curran, A. J., Wang, M., Dai, J., Bruckman, L. S., Jaubert, J-N., Davis, K. O., Braid, J. L., French, R. H. & Huey, B., 1/09/2020, In: Journal of Materials Science. 55, 25, p. 11501-11511 11 p.

    Research output: Contribution to Journal/MagazineJournal articlepeer-review

  4. Imaging 3D nanostructure of III-V on Si via cross-section SPM: quantum wells and nanowires - defects, polarity, local charges

    Kolosov, O., Mucientes, M., Forcieri, L., Jurczak, P., Tang, M., Lulla Ramrakhiyani, K., Gong, Y., Jarvis, S., Liu, H. & Wang, T., 21/07/2019.

    Research output: Contribution to conference - Without ISBN/ISSN Speech