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Results for Accelerating structure

Publications & Outputs

  1. Status of the compactlight design study*

    D’Auria, G., Di Mitri, S., Rochow, R., Latina, A., Liu, X., Rossi, C., Schulte, D., Stapnes, S., Wu, X., Wuensch, W., Castañeda Cortes, H. M., Clarke, J., Dunning, D., Thompson, N., Fang, W., Gazis, E., Gazis, N., Tanke, E., Trachnas, E., Goryashko, V. & 58 others, Jacewicz, M., Ruber, R., Taylor, G., Dowd, R., Zhu, D., Aksoy, A., Nergiz, Z., Apsimon, R., Burt, G., Castilla, A., Priem, H., Janssen, X., Luiten, J., Mutsaers, P., Stragier, X., Alesini, D., Bellaveglia, M., Buonomo, B., Cardelli, F., Croia, M., Diomede, M., Ferrario, M., Gallo, A., Giribono, A., Piersanti, L., Scifo, J., Spataro, B., Vaccarezza, C., Geometrante, R., Kokole, M., Arnesano, J., Bosco, F., Ficcadenti, L., Mostacci, A., Palumbo, L., Dattoli, G., Nguyen, F., Petralia, A., Marcos, J., Marin, E., Munoz Horta, R., Perez, F., Faus-Golfe, A., Han, Y., Bernhard, A., Gethmann, J., Calvi, M., Schmidt, T., Zhang, K., Esperante, D., Fuster, J., Gimeno, B., Gonzalez-Iglesias, D., Aicheler, M., Hoekstra, R., Cross, A. W., Nix, L. & Zhang, L., 5/11/2019, 39th International Free-Electron Laser Conference, FEL 2019. Geneva: JACoW, p. 738-741 4 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNConference contribution/Paperpeer-review

  2. Design of Planar Millimeter-Wave Metallic Structures for Wakefield Acceleration

    Zhang, L., He, W., Jamison, S., Whyte, C. G., Ronald, K., Phelps, A. D. R. & Cross, A. W., 1/01/2019, In: Journal of Infrared, Millimeter, and Terahertz Waves. 40, 1, p. 48-62 15 p.

    Research output: Contribution to journalJournal articlepeer-review

  3. Beam dynamics studies through dielectric THz accelerating structures: 29th International Linear Accelerator Conference, LINAC 2018

    Apsimon, R., Burt, G., Healy, A., Jamison, S., Latina, A., Appleby, R. B. & Smith, E., 21/09/2018, p. 569-572. 4 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review