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Results for BEXP

Publications & Outputs

  1. Quantifying anisotropic thermal transport in two-dimensional perovskite (PEA2PbI4) through cross-sectional scanning thermal microscopy

    Maiti, A., Agarwal, K., Gonzalez-Munoz, S. & Kolosov, O. V., 3/02/2023, In: Physical Review Materials. 7, 2, 11 p., 023801.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  2. Quantifying thermal transport in buried semiconductor nanostructures via Cross-Sectional Scanning Thermal Microscopy

    Spiece, J., Evangeli, C., Robson, A., Sachat, A., Hanel, L., Alonso, M., Garriga, M., Robinson, B., Oehme, M., Schulze, J., Alzina, F., Sotomayor-Torres, C. M. & Kolosov, O., 28/06/2021, In: Nanoscale. 13, 24, p. 10829-10836 8 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  3. Complementary sample preparation strategies (PVD/BEXP) combining with multifunctional SPM for the characterizations of battery interfacial properties

    Pan, H., Chen, Y., Pang, W., Sun, H., Li, J., Lin, Y., Kolosov, O. & Huang, Z., 1/02/2021, In: MethodsX. 8, 12 p., 101250.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  4. Direct nanoscale mapping of open circuit voltages at local back surface fields for PERC solar cells

    Longacre, A., Martin, M., Moran, T., Kolosov, O., Schneller, E., Curran, A. J., Wang, M., Dai, J., Bruckman, L. S., Jaubert, J-N., Davis, K. O., Braid, J. L., French, R. H. & Huey, B., 1/09/2020, In: Journal of Materials Science. 55, 25, p. 11501-11511 11 p.

    Research output: Contribution to Journal/Magazine › Journal article › peer-review

  5. Imaging 3D nanostructure of III-V on Si via cross-section SPM: quantum wells and nanowires - defects, polarity, local charges

    Kolosov, O., Mucientes, M., Forcieri, L., Jurczak, P., Tang, M., Lulla Ramrakhiyani, K., Gong, Y., Jarvis, S., Liu, H. & Wang, T., 21/07/2019.

    Research output: Contribution to conference - Without ISBN/ISSN › Speech

  6. Quantitative Measurements of Intrinsic Thermal Conductivity of Surface and Buried Nanoscale Layers via Cross-Sectional Scanning Thermal Microscopy – X-SThM

    Spiece, J., Evangeli, C., Robson, A. J., Robinson, B. J., Alzina, F. & Kolosov, O. V., 1/03/2017.

    Research output: Contribution to conference - Without ISBN/ISSN › Abstract › peer-review