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Results for Mixed Signal Test

Publications & Outputs

  1. Phase Locked Loop Test Methodology

    Richardson, A. & Burbidge, M., 2008, Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 277-306 30 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter (peer-reviewed)

  2. Test of A/D Converters

    Richardson, A. & Lechner, A., 2008, Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. Sun, Y. (ed.). Stevenage: IET Press, p. 213-234 22 p.

    Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSNChapter (peer-reviewed)

  3. Testing high resolution SD ADC’s by using the noise transfer function

    Richardson, A. & De-Venuto, D., 26/05/2004. 0 p.

    Research output: Contribution to conference - Without ISBN/ISSN Conference paperpeer-review