Submitted manuscript, 290 KB, PDF document
Available under license: CC BY-NC-ND
Research output: Contribution in Book/Report/Proceedings - With ISBN/ISSN › Chapter (peer-reviewed)
Publication date | 2008 |
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Host publication | Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits |
Editors | Yichuang Sun |
Place of Publication | Stevenage |
Publisher | IET Press |
Pages | 213-234 |
Number of pages | 22 |
ISBN (print) | 978-0-86341-745-0 |
<mark>Original language</mark> | English |